[smartmontools-support] self-test unknown failure

Tue Nov 2 03:10:22 CET 2021

Thanks for getting back to me.

I doubt I'll attempt any firmware upgrade/patch. This disk is in use in the
array now, and I don't want to put more stress on it having to resilver
again.

Some additional information. The error counters/rates appear to be
decreasing over time. I imagine if I wait long enough, the counters will
reach a low enough level where I will not be warned anymore.

# grep "/dev/sdf" /var/log/syslog | cut -d' ' -f 1-4,6-
Nov  1 00:58:44 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 66 to 65
Nov  1 03:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 65 to 64
Nov  1 03:58:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 64 to 62
Nov  1 04:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 62 to 61
Nov  1 05:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 61 to 60
Nov  1 05:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Usage
Attribute: 220 Disk_Shift changed from 100 to 1
Nov  1 06:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 60 to 59
Nov  1 07:58:43 smartd[1875]: Device: /dev/sdf [SAT], CHECK POWER STATUS
spins up disk (0x80 -> 0xff)
Nov  1 07:58:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 59 to 58
Nov  1 08:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Usage
Attribute: 220 Disk_Shift changed from 1 to 100
Nov  1 14:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 58 to 57
Nov  1 15:28:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 57 to 56
Nov  1 15:58:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 56 to 55
Nov  1 16:28:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 55 to 53
Nov  1 16:58:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 53 to 52
Nov  1 18:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 52 to 51
Nov  1 18:58:39 smartd[1875]: Device: /dev/sdf [SAT], FAILED SMART
self-check. BACK UP DATA NOW!
Nov  1 18:58:39 smartd[1875]: Device: /dev/sdf [SAT], Failed SMART usage
Attribute: 7 Seek_Error_Rate.
Nov  1 18:58:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 51 to 50
Nov  1 19:28:44 smartd[1875]: Device: /dev/sdf [SAT], FAILED SMART
self-check. BACK UP DATA NOW!
Nov  1 19:28:44 smartd[1875]: Device: /dev/sdf [SAT], Failed SMART usage
Attribute: 7 Seek_Error_Rate.
Nov  1 19:28:44 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure
Attribute: 7 Seek_Error_Rate changed from 50 to 49
Nov  1 19:58:43 smartd[1875]: Device: /dev/sdf [SAT], FAILED SMART
self-check. BACK UP DATA NOW!
Nov  1 19:58:43 smartd[1875]: Device: /dev/sdf [SAT], Failed SMART usage
Attribute: 7 Seek_Error_Rate.

On Mon, Nov 1, 2021 at 11:16 AM Christian Franke <
Christian.Franke at t-online.de> wrote:

> Ben Wood wrote:
> > I have a brand new 8GB Toshiba N300 disk that was used as a
> > replacement for a ZFS array.
> >
> > The disk had some seek errors as it was resilvering, but those errors
> > have cleared up. Self-tests are failing with "Completed: unknown
> > failure". I don't see any attributes that are undefined, so I'm not
> > sure how to clear the error on this disk. My OS keeps nagging me that
> > the disk is bad, but everything I can see says it's actually OK.
> >
>
> A similar issue with same "Self-test execution status" was reported for
> a "TOSHIBA MN08ACA14T" with firmware "0601":
> https://www.smartmontools.org/ticket/1510
>
> This is likely a disk firmware bug.
>
>
> > Is there a way to get a passing self-test, or clear the error on the
> > disk so it doesn't nag me anymore?
>
> Possibly not - except via new firmware which fixes the bug.
>
> This disk may support ATA Pending Defects log, but this is not included
> in 'smartctl -a' as this only prints legacy SMART info. Try 'smartctl
> -x' or 'smartctl -l defects' to see possible bad LBAs.
>
> Thanks,
> Christian
>
>
> >
> > # smartctl -q noserial -a /dev/sdf
> > smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.4.143-1-pve] (local build)
> > Copyright (C) 2002-20, Bruce Allen, Christian Franke,
> > www.smartmontools.org <http://www.smartmontools.org>
> >
> > === START OF INFORMATION SECTION ===
> > Device Model:     TOSHIBA HDWG180
> > Firmware Version: 0603
> > ...
> > Self-test execution status:      (  73) The previous self-test
> > completed having
> >                                         a test element that failed and
> > the test
> >                                         element that failed is not known.
> > ...
> > SMART Self-test log structure revision number 1
> > Num  Test_Description    Status                  Remaining
> >  LifeTime(hours)  LBA_of_first_error
> > # 1  Extended offline    Completed: unknown failure    90%     217
> >     0
> > # 2  Short offline       Completed: unknown failure    90%     125
> >     0
>
>
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