<div dir="ltr"><div>Thanks for getting back to me.</div><div><br></div><div>I doubt I'll attempt any firmware upgrade/patch. This disk is in use in the array now, and I don't want to put more stress on it having to resilver again.</div><div><br></div><div>Some additional information. The error counters/rates appear to be decreasing over time. I imagine if I wait long enough, the counters will reach a low enough level where I will not be warned anymore.</div><div><br></div><div><span style="font-family:monospace"># grep "/dev/sdf" /var/log/syslog | cut -d' ' -f 1-4,6-<br>Nov 1 00:58:44 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 66 to 65<br>Nov 1 03:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 65 to 64<br>Nov 1 03:58:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 64 to 62<br>Nov 1 04:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 62 to 61<br>Nov 1 05:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 61 to 60<br>Nov 1 05:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Usage Attribute: 220 Disk_Shift changed from 100 to 1<br>Nov 1 06:28:38 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 60 to 59<br>Nov 1 07:58:43 smartd[1875]: Device: /dev/sdf [SAT], CHECK POWER STATUS spins up disk (0x80 -> 0xff)<br>Nov 1 07:58:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 59 to 58<br>Nov 1 08:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Usage Attribute: 220 Disk_Shift changed from 1 to 100<br>Nov 1 14:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 58 to 57<br>Nov 1 15:28:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 57 to 56<br>Nov 1 15:58:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 56 to 55<br>Nov 1 16:28:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 55 to 53<br>Nov 1 16:58:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 53 to 52<br>Nov 1 18:28:43 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 52 to 51<br>Nov 1 18:58:39 smartd[1875]: Device: /dev/sdf [SAT], FAILED SMART self-check. BACK UP DATA NOW!<br>Nov 1 18:58:39 smartd[1875]: Device: /dev/sdf [SAT], Failed SMART usage Attribute: 7 Seek_Error_Rate.<br>Nov 1 18:58:39 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 51 to 50<br>Nov 1 19:28:44 smartd[1875]: Device: /dev/sdf [SAT], FAILED SMART self-check. BACK UP DATA NOW!<br>Nov 1 19:28:44 smartd[1875]: Device: /dev/sdf [SAT], Failed SMART usage Attribute: 7 Seek_Error_Rate.<br>Nov 1 19:28:44 smartd[1875]: Device: /dev/sdf [SAT], SMART Prefailure Attribute: 7 Seek_Error_Rate changed from 50 to 49<br>Nov 1 19:58:43 smartd[1875]: Device: /dev/sdf [SAT], FAILED SMART self-check. BACK UP DATA NOW!<br>Nov 1 19:58:43 smartd[1875]: Device: /dev/sdf [SAT], Failed SMART usage Attribute: 7 Seek_Error_Rate.</span></div><div><br></div></div><br><div class="gmail_quote"><div dir="ltr" class="gmail_attr">On Mon, Nov 1, 2021 at 11:16 AM Christian Franke <<a href="mailto:Christian.Franke@t-online.de">Christian.Franke@t-online.de</a>> wrote:<br></div><blockquote class="gmail_quote" style="margin:0px 0px 0px 0.8ex;border-left:1px solid rgb(204,204,204);padding-left:1ex">Ben Wood wrote:<br>
> I have a brand new 8GB Toshiba N300 disk that was used as a <br>
> replacement for a ZFS array.<br>
><br>
> The disk had some seek errors as it was resilvering, but those errors <br>
> have cleared up. Self-tests are failing with "Completed: unknown <br>
> failure". I don't see any attributes that are undefined, so I'm not <br>
> sure how to clear the error on this disk. My OS keeps nagging me that <br>
> the disk is bad, but everything I can see says it's actually OK.<br>
><br>
<br>
A similar issue with same "Self-test execution status" was reported for <br>
a "TOSHIBA MN08ACA14T" with firmware "0601":<br>
<a href="https://www.smartmontools.org/ticket/1510" rel="noreferrer" target="_blank">https://www.smartmontools.org/ticket/1510</a><br>
<br>
This is likely a disk firmware bug.<br>
<br>
<br>
> Is there a way to get a passing self-test, or clear the error on the <br>
> disk so it doesn't nag me anymore?<br>
<br>
Possibly not - except via new firmware which fixes the bug.<br>
<br>
This disk may support ATA Pending Defects log, but this is not included <br>
in 'smartctl -a' as this only prints legacy SMART info. Try 'smartctl <br>
-x' or 'smartctl -l defects' to see possible bad LBAs.<br>
<br>
Thanks,<br>
Christian<br>
<br>
<br>
><br>
> # smartctl -q noserial -a /dev/sdf<br>
> smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.4.143-1-pve] (local build)<br>
> Copyright (C) 2002-20, Bruce Allen, Christian Franke, <br>
> <a href="http://www.smartmontools.org" rel="noreferrer" target="_blank">www.smartmontools.org</a> <<a href="http://www.smartmontools.org" rel="noreferrer" target="_blank">http://www.smartmontools.org</a>><br>
><br>
> === START OF INFORMATION SECTION ===<br>
> Device Model: TOSHIBA HDWG180<br>
> Firmware Version: 0603<br>
> ...<br>
> Self-test execution status: ( 73) The previous self-test <br>
> completed having<br>
> a test element that failed and <br>
> the test<br>
> element that failed is not known.<br>
> ...<br>
> SMART Self-test log structure revision number 1<br>
> Num Test_Description Status Remaining <br>
> LifeTime(hours) LBA_of_first_error<br>
> # 1 Extended offline Completed: unknown failure 90% 217 <br>
> 0<br>
> # 2 Short offline Completed: unknown failure 90% 125 <br>
> 0<br>
<br>
</blockquote></div>