[smartmontools-support] Strange SMART value with TOSHIBA drive through eSATA

Pascal Darré pascal.darre at gmail.com
Thu May 6 21:51:25 CEST 2021


Hello

Platform: DELL 6410 (i5) running a fresh Debian Buster
smartctl: smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.19.0-16-amd64]

I bought a brand new TOSHIBA 3TB drive and connected first to an USB
2.0 <-> SATA connector. I did not realize that my laptop USB was not
USB3, so I connected though an other adapter to connect with eSATA to
my laptop.
In both cases, SMART report were saying my drive was "old" or "prefail".
Is it normal? I thought it would either work or not, but not to get
those strange values...

Any hint welcome

Here is the full report smarttcl report:

smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.19.0-16-amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Toshiba P300
Device Model:     TOSHIBA HDWD130
Serial Number:    Y0I276JAS
LU WWN Device Id: 5 000039 fc0c103cf
Firmware Version: MX6OACF0
User Capacity:    3,000,592,982,016 bytes [3.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    7200 rpm
Form Factor:      3.5 inches
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS T13/1699-D revision 4
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Thu May  6 18:00:15 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84) Offline data collection activity
                                        was suspended by an
interrupting command from host.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                (20931) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection
on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        ( 349) minutes.
SCT capabilities:              (0x003d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail
Always       -       0
  2 Throughput_Performance  0x0005   140   140   054    Pre-fail
Offline      -       68
  3 Spin_Up_Time            0x0007   133   133   024    Pre-fail
Always       -       433 (Average 431)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age
Always       -       137
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail
Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail
Always       -       0
  8 Seek_Time_Performance   0x0005   124   124   020    Pre-fail
Offline      -       33
  9 Power_On_Hours          0x0012   100   100   000    Old_age
Always       -       208
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail
Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age
Always       -       4
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age
Always       -       161
193 Load_Cycle_Count        0x0012   100   100   000    Old_age
Always       -       161
194 Temperature_Celsius     0x0002   139   139   000    Old_age
Always       -       43 (Min/Max 24/48)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age
Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age
Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age
Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age
Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining
LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%         1         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


thanks
Pascal


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