[Smartmontools-database] [EXT] Re: Addition of Micron 5300 Enterprise SSD

[Jerry Ledingham (jledingham)]

+Anthony

Hi Milan,

That was my first submission, so I may not have done it correctly - my apologies, if that is the case.  I am also not on the technical side.  Here is what my technical guy said:
The "raw value does start at 0 and count up but it's not a percentage. The Attribute names are based upon the Current & Worst values which are percentages of Life Remaining (not Life used).

Let me know if you have additional questions.

Best regards,
Jerry

Jerry Ledingham
Manager, Customer Qualification Team - SSD
Micron Technology, Inc.
Office:  +1 (720) 494-5279  Mobile:  +1 (303) 358-0153
Email: jledingham at micron.com  Website: micron.com
This email and any attachments contained within may contain confidential and proprietary information.

-----Original Message-----
From: Milan Kupcevic <milan_kupcevic at harvard.edu> 
Sent: Thursday, December 12, 2019 9:14 AM
To: Jerry Ledingham (jledingham) <jledingham at micron.com>; smartmontools-database at listi.jpberlin.de
Subject: [EXT] Re: [Smartmontools-database] Addition of Micron 5300 Enterprise SSD

On 2019-12-11 13:05, Jerry Ledingham (jledingham) wrote:
>   {"Micron 5100/5200/5210/5300 Enterprise SSDs",
> 
>     "Micron_5100_(EE|MT)FDDA[KV](240|480|960|1T9|3T8|7T6)T(BY|CB|CC)|"
> // tested with Micron_5100_MTFDDAK1T9TBY
> 
>     "Micron_5200_(EE|MT)FDDA[KV](240|480|960|1T9|3T8|7T6)TD(C|D|N)|"
> // tested with Micron_5200_MTFDDAK960TDC
> 
>     "Micron_5210_(EE|MT)FDDAK(1T9|3T8|7T6)QDE|"
> // tested with Micron_5210_MTFDDAK1T9QDC
> 
>     "Micron_5300_(EE|MT)FDDA[KV](240|480|960|1T9|3T8|7T6)TD(U|S|T)",
> // tested with Micron_5300_MTFDDAK960TDS


[...]

> 
>     "-v 202,raw48,Percent_Lifetime_Remain "
> 

[...]


Technical documentation clearly states that "the Raw Data value starts at 0% and counts up."[0][1] Accordingly, ID 202 raw48 reading should be Percent_Lifetime_Used not Percent_Lifetime_Remain. See page 23 in two reference documents:


[0]
https://www.micron.com/-/media/client/global/documents/products/technical-note/solid-state-storage/tnfd34_5100_ssd_smart_implementation.pdf
[1]
https://www.micron.com/-/media/client/global/documents/products/technical-note/solid-state-storage/tnfd40_5200_ssd_smart_implementation.pdf



--
Milan Kupcevic
Senior Cyberinfrastructure Engineer at Project NESE Harvard University FAS Research Computing