[Smartmontools-database] Addition of Micron 5300 Enterprise SSD

Milan Kupcevic milan_kupcevic at harvard.edu
Thu Dec 12 17:13:43 CET 2019


On 2019-12-11 13:05, Jerry Ledingham (jledingham) wrote:
>   {"Micron 5100/5200/5210/5300 Enterprise SSDs",
> 
>     "Micron_5100_(EE|MT)FDDA[KV](240|480|960|1T9|3T8|7T6)T(BY|CB|CC)|"
> // tested with Micron_5100_MTFDDAK1T9TBY
> 
>     "Micron_5200_(EE|MT)FDDA[KV](240|480|960|1T9|3T8|7T6)TD(C|D|N)|"  
> // tested with Micron_5200_MTFDDAK960TDC
> 
>     "Micron_5210_(EE|MT)FDDAK(1T9|3T8|7T6)QDE|"                       
> // tested with Micron_5210_MTFDDAK1T9QDC
> 
>     "Micron_5300_(EE|MT)FDDA[KV](240|480|960|1T9|3T8|7T6)TD(U|S|T)",  
> // tested with Micron_5300_MTFDDAK960TDS


[...]

> 
>     "-v 202,raw48,Percent_Lifetime_Remain "
> 

[...]


Technical documentation clearly states that "the Raw Data value starts
at 0% and counts up."[0][1] Accordingly, ID 202 raw48 reading should be
Percent_Lifetime_Used not Percent_Lifetime_Remain. See page 23 in two
reference documents:


[0]
https://www.micron.com/-/media/client/global/documents/products/technical-note/solid-state-storage/tnfd34_5100_ssd_smart_implementation.pdf
[1]
https://www.micron.com/-/media/client/global/documents/products/technical-note/solid-state-storage/tnfd40_5200_ssd_smart_implementation.pdf



-- 
Milan Kupcevic
Senior Cyberinfrastructure Engineer at Project NESE
Harvard University
FAS Research Computing


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