[smartmontools-support] HGST 7K6000 and SMART tests

[Gandalf Corvotempesta]

Il giorno gio 26 apr 2018 alle ore 07:20 Christian Franke <
Christian.Franke at t-online.de> ha scritto:
> Please provide the smartd.conf file and the output of "smartd -q
showtests".

$ cat /etc/smartd.conf
DEVICESCAN -d removable -m x -a -o on -S on -s (S/../.././02|L/../../6/03)
-W 3

$ smartd -q showtests

Configuration file /etc/smartd.conf was parsed, found DEVICESCAN, scanning
devices
glob(3) found no matches for pattern /dev/hd[a-t]
glob(3) found no matches for pattern /dev/sd[a-c][a-z]
Device: /dev/sda, type changed from 'scsi' to 'sat'
Device: /dev/sda [SAT], opened
Device: /dev/sda [SAT], WDC WD5003ABYZ-011FA0, S/N:WD-WMAYP0KAPEER,
WWN:5-0014ee-004295610, FW:01.01S03, 500 GB
Device: /dev/sda [SAT], not found in smartd database.
Device: /dev/sda [SAT], enabled SMART Attribute Autosave.
Device: /dev/sda [SAT], enabled SMART Automatic Offline Testing.
Device: /dev/sda [SAT], is SMART capable. Adding to "monitor" list.
Device: /dev/sda [SAT], state read from
/var/lib/smartmontools/smartd.WDC_WD5003ABYZ_011FA0-WD_WMAYP0KAPEER.ata.state
Device: /dev/sdb, type changed from 'scsi' to 'sat'
Device: /dev/sdb [SAT], opened
Device: /dev/sdb [SAT], WDC WD5003ABYZ-011FA0, S/N:WD-WMAYP0K3XAMR,
WWN:5-0014ee-004295425, FW:01.01S03, 500 GB
Device: /dev/sdb [SAT], not found in smartd database.
Device: /dev/sdb [SAT], enabled SMART Attribute Autosave.
Device: /dev/sdb [SAT], enabled SMART Automatic Offline Testing.
Device: /dev/sdb [SAT], is SMART capable. Adding to "monitor" list.
Device: /dev/sdb [SAT], state read from
/var/lib/smartmontools/smartd.WDC_WD5003ABYZ_011FA0-WD_WMAYP0K3XAMR.ata.state
Device: /dev/sdc, type changed from 'scsi' to 'sat'
Device: /dev/sdc [SAT], opened
Device: /dev/sdc [SAT], WDC WD5003ABYZ-011FA0, S/N:WD-WMAYP0K2D2CY,
WWN:5-0014ee-0043811c0, FW:01.01S03, 500 GB
Device: /dev/sdc [SAT], not found in smartd database.
Device: /dev/sdc [SAT], enabled SMART Attribute Autosave.
Device: /dev/sdc [SAT], enabled SMART Automatic Offline Testing.
Device: /dev/sdc [SAT], is SMART capable. Adding to "monitor" list.
Device: /dev/sdc [SAT], state read from
/var/lib/smartmontools/smartd.WDC_WD5003ABYZ_011FA0-WD_WMAYP0K2D2CY.ata.state
Device: /dev/sdd, opened
Device: /dev/sdd, [HGST     HUS726020ALS210  AD05], lu id:
0x5000cca25e5ecfbc, S/N: K5HP4EDD, 2,00 TB
Device: /dev/sdd, enabled autosave (cleared GLTSD bit).
Device: /dev/sdd, is SMART capable. Adding to "monitor" list.
Device: /dev/sdd, state read from
/var/lib/smartmontools/smartd.HGST-HUS726020ALS210-K5HP4EDD.scsi.state
Device: /dev/sde, opened
Device: /dev/sde, [HGST     HUS726020ALS210  AD05], lu id:
0x5000cca25e5eaae0, S/N: K5HP1Z9D, 2,00 TB
Device: /dev/sde, enabled autosave (cleared GLTSD bit).
Device: /dev/sde, is SMART capable. Adding to "monitor" list.
Device: /dev/sde, state read from
/var/lib/smartmontools/smartd.HGST-HUS726020ALS210-K5HP1Z9D.scsi.state
Monitoring 3 ATA and 2 SCSI devices

Next scheduled self tests (at most 5 of each type per device):
Device: /dev/sda [SAT], will do test 1 of type S at Fri Apr 27 02:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 1 of type S at Fri Apr 27 02:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 1 of type S at Fri Apr 27 02:24:56
2018 CEST
Device: /dev/sdd, will do test 1 of type S at Fri Apr 27 02:24:56 2018 CEST
Device: /dev/sde, will do test 1 of type S at Fri Apr 27 02:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 2 of type S at Sat Apr 28 02:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 2 of type S at Sat Apr 28 02:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 2 of type S at Sat Apr 28 02:24:56
2018 CEST
Device: /dev/sdd, will do test 2 of type S at Sat Apr 28 02:24:56 2018 CEST
Device: /dev/sde, will do test 2 of type S at Sat Apr 28 02:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 1 of type L at Sat Apr 28 03:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 1 of type L at Sat Apr 28 03:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 1 of type L at Sat Apr 28 03:24:56
2018 CEST
Device: /dev/sdd, will do test 1 of type L at Sat Apr 28 03:24:56 2018 CEST
Device: /dev/sde, will do test 1 of type L at Sat Apr 28 03:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 3 of type S at Sun Apr 29 02:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 3 of type S at Sun Apr 29 02:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 3 of type S at Sun Apr 29 02:24:56
2018 CEST
Device: /dev/sdd, will do test 3 of type S at Sun Apr 29 02:24:56 2018 CEST
Device: /dev/sde, will do test 3 of type S at Sun Apr 29 02:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 4 of type S at Mon Apr 30 02:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 4 of type S at Mon Apr 30 02:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 4 of type S at Mon Apr 30 02:24:56
2018 CEST
Device: /dev/sdd, will do test 4 of type S at Mon Apr 30 02:24:56 2018 CEST
Device: /dev/sde, will do test 4 of type S at Mon Apr 30 02:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 5 of type S at Tue May  1 02:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 5 of type S at Tue May  1 02:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 5 of type S at Tue May  1 02:24:56
2018 CEST
Device: /dev/sdd, will do test 5 of type S at Tue May  1 02:24:56 2018 CEST
Device: /dev/sde, will do test 5 of type S at Tue May  1 02:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 2 of type L at Sat May  5 03:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 2 of type L at Sat May  5 03:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 2 of type L at Sat May  5 03:24:56
2018 CEST
Device: /dev/sdd, will do test 2 of type L at Sat May  5 03:24:56 2018 CEST
Device: /dev/sde, will do test 2 of type L at Sat May  5 03:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 3 of type L at Sat May 12 03:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 3 of type L at Sat May 12 03:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 3 of type L at Sat May 12 03:24:56
2018 CEST
Device: /dev/sdd, will do test 3 of type L at Sat May 12 03:24:56 2018 CEST
Device: /dev/sde, will do test 3 of type L at Sat May 12 03:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 4 of type L at Sat May 19 03:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 4 of type L at Sat May 19 03:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 4 of type L at Sat May 19 03:24:56
2018 CEST
Device: /dev/sdd, will do test 4 of type L at Sat May 19 03:24:56 2018 CEST
Device: /dev/sde, will do test 4 of type L at Sat May 19 03:24:56 2018 CEST
Device: /dev/sda [SAT], will do test 5 of type L at Sat May 26 03:24:56
2018 CEST
Device: /dev/sdb [SAT], will do test 5 of type L at Sat May 26 03:24:56
2018 CEST
Device: /dev/sdc [SAT], will do test 5 of type L at Sat May 26 03:24:56
2018 CEST
Device: /dev/sdd, will do test 5 of type L at Sat May 26 03:24:56 2018 CEST
Device: /dev/sde, will do test 5 of type L at Sat May 26 03:24:56 2018 CEST

Totals [Thu Apr 26 10:24:56 2018 CEST - Wed Jul 25 10:24:56 2018 CEST]:
Device: /dev/sda [SAT], will do  13 tests of type L
Device: /dev/sda [SAT], will do  90 tests of type S
Device: /dev/sda [SAT], will do   0 tests of type C
Device: /dev/sda [SAT], will do   0 tests of type O
Device: /dev/sdb [SAT], will do  13 tests of type L
Device: /dev/sdb [SAT], will do  90 tests of type S
Device: /dev/sdb [SAT], will do   0 tests of type C
Device: /dev/sdb [SAT], will do   0 tests of type O
Device: /dev/sdc [SAT], will do  13 tests of type L
Device: /dev/sdc [SAT], will do  90 tests of type S
Device: /dev/sdc [SAT], will do   0 tests of type C
Device: /dev/sdc [SAT], will do   0 tests of type O
Device: /dev/sdd, will do  13 tests of type L
Device: /dev/sdd, will do  90 tests of type S
Device: /dev/sde, will do  13 tests of type L
Device: /dev/sde, will do  90 tests of type S





but I have some news.
Scheduled tests not running are due to last test stuck in "Self test in
progress ..."
It seems that smartd checks for any running test in "slot" #0, if still
running, it doesn't run another test.
I've fixed that by manually running a short test. This moved the "stuck"
test from #0 to #1 and now sheduled tests are working again.

There are still some strangeness:
1) every SAS disks that I have, has Backgrund Scanning automatically turned
on. Don't know if this is enabled by smartd or is automatically set on
disks by the vendor.
With this 7K6000 I had to manually enable the backgrund scanning with
"sdparm --set EN_BMS"

2) smartd doesn't detect a finished long test. I had to hard-reboot the
server (for a different issue) during the smart long test and not that test
is stuck in "Self test in progress"
Is possible to clear the self-test log in some way ?

3) any differences in "SAS Backgrund Media Scan" and "SMART Long test" ?