smartctl 6.6 2017-11-05 r4594 [Darwin 16.7.0 x86_64] (local build) Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: CT1000MX500SSD1 Firmware Version: M3CR020 User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Jul 16 08:47:56 2018 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Write SCT (Get) Feature Control Command failed: Undefined error: 0 Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0031) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 16 12 Power_Cycle_Count -O--CK 100 100 000 - 26 171 Unknown_Attribute -O--CK 100 100 000 - 0 172 Unknown_Attribute -O--CK 100 100 000 - 0 173 Unknown_Attribute -O--CK 100 100 000 - 0 174 Unknown_Attribute -O--CK 100 100 000 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 41 183 Runtime_Bad_Block -O--CK 100 100 000 - 0 184 End-to-End_Error -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 062 052 000 - 38 (Min/Max 0/48) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_Sector -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 202 Unknown_SSD_Attribute ----CK 100 100 001 - 0 206 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0 210 Unknown_Attribute -O--CK 100 100 000 - 0 246 Unknown_Attribute -O--CK 100 100 000 - 1586575 247 Unknown_Attribute -O--CK 100 100 000 - 25887 248 Unknown_Attribute -O--CK 100 100 000 - 1020 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x04 SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x30 SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f SL R/W 16 Host vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 Warning: ATA error count 0 inconsistent with error log pointer 1 ATA Error Count: 0 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 0 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 ec 00 00 00 00 00 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE c8 00 00 00 00 00 00 00 00:00:00.000 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 5 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) SCT Support Level: 0 Device State: Active (0) Current Temperature: 38 Celsius Power Cycle Min/Max Temperature: 31/38 Celsius Lifetime Min/Max Temperature: 0/48 Celsius Under/Over Temperature Limit Count: 0/0 Write SCT Data Table failed: Undefined error: 0 Read SCT Temperature History failed SCT Error Recovery Control command not supported Device Statistics (SMART Log 0x04) Page Offset Size Value Flags Description ATA_SMART_READ_LOG failed: Undefined error: 0 Read Device Statistics pages 0x00-0x07 failed Pending Defects log (GP Log 0x0c) not supported ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented Read SATA Phy Event Counters failed