[Smartmontools-database] SAMSUNG SV0761H
Ondrej Zary
linux at zary.sk
Sun Mar 1 00:15:56 CET 2020
SAMSUNG SV0761H seems to require -v 9,halfminutes but not -Fsamsung
The same is probably true for all V20400 drives:
{ "SAMSUNG SpinPoint V20400", // tested with SV0761H/PT100-01
"SAMSUNG SV(4084|3063|2042|1021|0761)H",
"",
"",
"-v 9,halfminutes"
},
smartctl 6.6 2017-11-05 r4594 [i686-linux-4.19.0-6-686] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SV0761H
Firmware Version: PT100-01
User Capacity: 7,653,703,680 bytes [7.65 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-6, ATA/ATAPI-4 T13/1153D revision 17
Local Time is: Sun Mar 1 00:11:17 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 240) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 4) minutes.
SMART Attributes Data Structure revision number: 9
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 100 100 051 - 33
4 Start_Stop_Count -O--CK 087 087 000 - 13421
5 Reallocated_Sector_Ct PO--CK 253 253 010 - 0
7 Seek_Error_Rate -O-R-- 253 253 051 - 0
8 Seek_Time_Performance --S--K 253 253 000 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1033479
12 Power_Cycle_Count -O--CK 095 095 000 - 5269
197 Current_Pending_Sector -O--CK 253 253 010 - 0
198 Offline_Uncorrectable ----CK 253 253 010 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0
200 Multi_Zone_Error_Rate -O-R-- 100 100 051 - 0
201 Soft_Read_Error_Rate -O-R-- 100 100 051 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
Read SMART Log Directory failed: scsi error badly formed scsi parameters
General Purpose Log Directory not supported
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
Warning: ATA error count 250 inconsistent with error log pointer 3
ATA Error Count: 250 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 250 occurred at disk power-on lifetime: 8612 hours (358 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 88 01 00 4f c2 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 00 4f c2 00 00 00:49:30.000 SMART READ LOG
b0 da 00 00 4f c2 00 00 00:49:30.000 SMART RETURN STATUS
b0 d1 01 01 4f c2 00 00 00:49:30.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 00 00 00:49:30.000 SMART READ DATA
ec 00 01 00 00 00 00 00 00:49:30.000 IDENTIFY DEVICE
Error 249 occurred at disk power-on lifetime: 8612 hours (358 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 88 01 00 4f c2 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 00 4f c2 00 00 00:44:48.000 SMART READ LOG
b0 da 00 00 4f c2 00 00 00:44:48.000 SMART RETURN STATUS
b0 d1 01 01 4f c2 00 00 00:44:48.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 00 00 00:44:48.000 SMART READ DATA
ec 00 01 00 00 00 00 00 00:44:48.000 IDENTIFY DEVICE
Error 248 occurred at disk power-on lifetime: 8612 hours (358 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 88 01 00 4f c2 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 00 4f c2 00 00 00:40:18.000 SMART READ LOG
b0 da 00 00 4f c2 00 00 00:40:18.000 SMART RETURN STATUS
b0 d1 01 01 4f c2 00 00 00:40:18.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 00 00 00:40:18.000 SMART READ DATA
ec 00 01 00 00 00 00 00 00:40:18.000 IDENTIFY DEVICE
Error 247 occurred at disk power-on lifetime: 8611 hours (358 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 88 00 01 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
a1 ff 00 01 00 00 a0 00 00:00:03.000 IDENTIFY PACKET DEVICE
c4 ff 01 01 00 00 a0 00 00:00:03.000 READ MULTIPLE
91 ff 3f 00 00 00 af 00 00:00:03.000 INITIALIZE DEVICE PARAMETERS [OBS-6]
c6 ff 10 00 00 00 a0 00 00:00:03.000 SET MULTIPLE MODE
91 ff 3f 00 00 00 af 00 00:00:03.000 INITIALIZE DEVICE PARAMETERS [OBS-6]
Error 246 occurred at disk power-on lifetime: 8611 hours (358 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 80 01 01 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 01 4f c2 00 00 00:49:30.000 SMART READ LOG
a1 ff 00 01 00 00 a0 00 00:27:59.000 IDENTIFY PACKET DEVICE
c4 ff 01 01 00 00 a0 00 00:27:59.000 READ MULTIPLE
91 ff 3f 00 00 00 af 00 00:27:59.000 INITIALIZE DEVICE PARAMETERS [OBS-6]
c6 ff 10 00 00 00 a0 00 00:27:59.000 SET MULTIPLE MODE
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Selective Self-tests/Logging not supported
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported
--
Ondrej Zary
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