[Smartmontools-database] missing device in database
Heinz Schwartz
kernrad at mail.de
Wed Jan 29 17:38:24 CET 2020
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smartctl 6.6 2016-05-31 r4324 [i686-linux-4.19.0-5-686-pae] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: ADATA SU650
Firmware Version: S0212B0
User Capacity: 480.103.981.056 bytes [480 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Wed Jan 29 17:17:47 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x11) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
9 Power_On_Hours -O--CK 100 100 050 - 2798
12 Power_Cycle_Count -O--CK 100 100 050 - 217
160 Unknown_Attribute -O--CK 100 100 050 - 0
161 Unknown_Attribute PO--CK 100 100 050 - 100
163 Unknown_Attribute -O--CK 100 100 050 - 6
164 Unknown_Attribute -O--CK 100 100 050 - 34889
165 Unknown_Attribute -O--CK 100 100 050 - 187
166 Unknown_Attribute -O--CK 100 100 050 - 6
167 Unknown_Attribute -O--CK 100 100 050 - 24
168 Unknown_Attribute -O--CK 100 100 050 - 5050
169 Unknown_Attribute -O--CK 100 100 050 - 100
175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
177 Wear_Leveling_Count -O--CK 100 100 050 - 0
178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
192 Power-Off_Retract_Count -O--CK 100 100 050 - 19
194 Temperature_Celsius -O---K 100 100 050 - 28
195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0
196 Reallocated_Event_Count -O--CK 100 100 050 - 0
197 Current_Pending_Sector -O--CK 100 100 050 - 0
198 Offline_Uncorrectable -O--CK 100 100 050 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 26
232 Available_Reservd_Space -O--CK 100 100 050 - 100
241 Total_LBAs_Written ----CK 100 100 050 - 50982
242 Total_LBAs_Read ----CK 100 100 050 - 77924
245 Unknown_Attribute -O--CK 100 100 050 - 48359
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x10 GPL R/O 1 SATA NCQ Queued Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xde GPL VS 8 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 27 (device log contains only the most recent 4 errors)
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 27 [2] log entry is empty
Error 26 [1] log entry is empty
Error 25 [0] log entry is empty
Error 24 [3] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
00 -- 00 00 00 00 00 00 00 00 00 00 00
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
b0 00 d1 01 01 00 00 4f 00 c2 01 00 08 00:00:00.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
2f 00 00 01 01 00 00 00 00 00 03 00 08 00:00:00.000 READ LOG EXT
2f 00 00 01 01 00 00 00 00 00 00 00 08 00:00:00.000 READ LOG EXT
b0 00 d5 01 01 00 00 4f 00 c2 00 00 08 00:00:00.000 SMART READ LOG
b0 00 da 00 00 00 00 4f 00 c2 00 00 08 00:00:00.000 SMART RETURN STATUS
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 2796 -
# 2 Extended offline Completed without error 00% 2714 -
Selective Self-tests/Logging not supported
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 217 --- Lifetime Power-On Resets
0x01 0x010 4 2798 --- Power-on Hours
0x01 0x018 6 3341194623 --- Logical Sectors Written
0x01 0x020 6 70701 --- Number of Write Commands
0x01 0x028 6 811900259 --- Logical Sectors Read
0x01 0x030 6 54109 --- Number of Read Commands
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x000a 4 5 Device-to-host register FISes sent due to a COMRESET
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